GenTech Scientific
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Featured Analytical Instrument

JEOL JSM-5900LV Scanning Electron Microscope

JEOL JSM-5900LV Scanning Electron Microscope

The SEM is a sophisticated, high resolution analytical instrument used to characterize the structure and composition of materials, typically on a micrometer length scale. The JSM-5900 LV SEM can operate in high as well as in low vacuum mode. Low vacuum mode extends SEM capabilities by allowing observation of specimens which, due to water content or nonconductive surfaces, cannot be viewed at high vacuum.